Quantum Focus International InfraScope II: Industry standard tool for measuring junction temperature.  Employs pixel-by-pixel emissivity correction to determine accurate temperature with minimum spatial resolution ~2.5μm spot size. Measurements are compared with 3D finite element models and show excellent agreement.  Combination of experimental and simulation results are used to determine the thermal resistance of each product.

Accel-RF AARTS RF10000-16 10GHz, 16 channel RF stress and pulsed DC tester. CW RF stimulus is used to look for additional mechanisms induced by RF drive.  Pulsed DC test data are taken to verify pulsed reliability simulations and predictions.

DC High Temperature Operating Life (HTOL) Test Rack: Every product is qualified using a high temperature operating life test. For new products qualification usually last 1,000+ hours.  DC and RF test data are taken at set intervals and used to predict drift and ensure reliable operation.

3 temperature DC Oven : 90 DUT capacity capable of maintaining  150°C to 350°C junction temperatures to determine Activation Energy and Arrhenius curve of our products.

RF High Temperature Operating Life (HTOL): RF HTOL rack developed in collaboration with NSWC Crane is used to verify expectations of operating life with RF drive applied.